Chemical reaction path for thin film oxidation of stainless steel

被引：31

作者：

Shibagaki, S

Koga, A

Shirakawa, Y

Onishi, H

Yokokawa, H

Tanaka, J

机构：

[1] SHINKO PANTEC CO LTD,TECH RES CTR,NISHI KU,KOBE,HYOGO 65122,JAPAN

[2] NATL INST MAT & CHEM RES,TSUKUBA,IBARAKI 305,JAPAN

[3] NATL INST RES INORGAN MAT,TSUKUBA,IBARAKI 305,JAPAN

来源：

THIN SOLID FILMS | 1997年 / 303卷 / 1-2期

关键词：

Auger electron spectroscopy; oxides;

D O I：

10.1016/S0040-6090(97)00130-2

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

An oxide thin film formed on a stainless steel is analyzed by microfocused Auger electron spectroscopy (mu AES): the oxide film consists of five sublayers of 2 to 4 nm in thickness. A chemical reaction path of this system is elucidated by comparing a chemical potential diagram with the elementary distribution observed; thereby the phases in the thin film are specified. The diffusion property of this system is discussed in relation to the chemical reaction path and it is indicated that an up-hill diffusion occurs in the oxide thin film. (C) 1997 Elsevier Science S.A.

引用

页码：101 / 106

页数：6

共 11 条

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CLARK JB, 1963, T METALL SOC AIME, V227, P1250

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