Measurement of charge transfer in YBa2Cu3O7 using a novel electron diffraction method

被引：19

作者：

Zhu, YM ^{[1
]}

Tafto, J ^{[1
]}

机构：

[1] UNIV OSLO,DEPT PHYS,N-0316 BLINDERN,OSLO,NORWAY

来源：

PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES | 1997年 / 75卷 / 05期

关键词：

D O I：

10.1080/13642819708202354

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We present a novel experimental approach, based on electron diffraction, of determining the amplitudes and phases of Bragg reflections at low angles. This technique was used to measure charge transfer in YBa2Cu3O7. The determined value of the structure factor of the (001) reflection, which is very sensitive to the distribution of valence electron in the crystal unit cell, corresponds in the purely ionic model to 76 +/- 8% of the electron holes being located in the CuO2 planes of fully oxygenated samples.

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页码：785 / 791

页数：7

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