Eye pattern evaluation in high-speed digital systems analysis by using MTL modeling

被引：12

作者：

Antonini, G ^{[1
]}

Drewniak, JL

Orlandi, A

Ricchiuti, V

机构：

[1] Univ Aquila, Dept Elect Engn, I-67040 Laquila, Italy

[2] Univ Missouri, Dept Elect & Comp Engn, Electromagnet Compatibil Lab, Rolla, MO 65409 USA

[3] CNX SpA, I-67100 Laquila, Italy

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 2002年 / 50卷 / 07期

关键词：

dielectric constant; dissipation factor; frequency-dependent dielectric; signal integrity;

D O I：

10.1109/TMTT.2002.800443

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A method for simulating the eye pattern of high-speed digital signals propagated on printed circuit boards using multi-conductor transmission-line modeling is proposed in this paper. The approach takes into account the frequency-dependent properties of the dielectric materials of the board and of the conductors. The validation is performed by comparing the modeling with measurements taken from the literature, and directly performed on test boards specially design for this study.

引用

页码：1807 / 1815

页数：9