Quantifying the Semiconducting Fraction in Single-Walled Carbon Nanotube Samples through Comparative Atomic Force and Photoluminescence Microscopies

被引：53

作者：

Naumov, Anton V. ^{[3
]}

Kuznetsov, Oleg A. ^{[4
]}

Harutyunyan, Avetik R. ^{[4
]}

Green, Alexander A. ^{[5
]}

Hersam, Mark C. ^{[5
]}

Resasco, Daniel E. ^{[6
]}

Nikolaev, Pavel N. ^{[7
]}

Weisman, R. Bruce ^{[1
,2
]}

机构：

[1] Rice Univ, Dept Chem, Houston, TX 77005 USA

[2] Rice Univ, Richard E Smalley Inst Nanoscale Sci & Technol, Houston, TX 77005 USA

[3] Rice Univ, Appl Phys Program, Houston, TX 77005 USA

[4] Honda Res Inst USA Inc, Columbus, OH 43212 USA

[5] Northwestern Univ, Dept Chem, Dept Mat Sci & Engn, Evanston, IL 60208 USA

[6] Univ Oklahoma, Sch Chem Biol & Mat Engn, Norman, OK 73019 USA

[7] NASA, Lyndon B Johnson Space Ctr, ERC Inc, Houston, TX 77058 USA

来源：

NANO LETTERS | 2009年 / 9卷 / 09期

基金：

美国国家科学基金会;

关键词：

ELECTRONIC-STRUCTURE; GROWTH; TRANSPARENT; ENRICHMENT; CO; DISPROPORTIONATION; FLUORESCENCE; SEPARATION; DIAMETER; SWNTS;

D O I：

10.1021/nl9014342

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

A new method was used to measure the fraction of semiconducting nanotubes in various as-grown or processed single-walled carbon nanotube (SWCNT) samples. SWCNT number densities were compared in images from near-IR photoluminescence (semiconducting species) and AFM (all species) to compute the semiconducting fraction. The results show large variations among growth methods and effective sorting by density gradient ultracentrifugation. This counting-based method provides important information about SWCNT sample compositions that can guide controlled growth methods and help calibrate bulk characterization techniques.

引用

页码：3203 / 3208

页数：6

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[1] Characterization of single-walled carbon nanotubes (SWNTs) produced by CO disproportionation on Co-Mo catalysts [J].