Surface-plasmon resonance spectrometry and characterization of absorbing liquids

被引:46
作者
Kolomenskii, AA [1 ]
Gershon, PD
Schuessler, HA
机构
[1] Texas A&M Univ, Dept Phys, College Stn, TX 77843 USA
[2] Texas A&M Univ, Inst Biosci & Technol, Dept Biochem & Biophys, Houston, TX 77030 USA
关键词
D O I
10.1364/AO.39.003314
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The effect of absorption of the sample medium on the surface-plasmon resonance (SPR) characteristics is analyzed by approximate analytical and exact numerical models. We show that absorption leads to specific changes in the value of reflectivity near the SPR angle and that these can be used for absorbance detection. The strongest absorption-induced change in reflectivity occurs at two values of metal film thickness (28 and 55 nm for a gold film and lambda = 632.8 nm). Using a sample solution of Rhodamine 700 in ethanol, we measured the characteristic changes in the SPR angle and in reflectivity over the wavelength interval encompassing the strong absorption band at 610-680 nm. The possibility of the simultaneous determination of the refractive index and absorption from SPR measurements is demonstrated and has the potential for substance-specific detection. (C) 2000 Optical Society of America OCIS codes: 240.6680, 260.5470, 260.6970, 170.0170.
引用
收藏
页码:3314 / 3320
页数:7
相关论文
共 21 条
[1]   OVERALL CHARACTERISTICS OF A LIQUID-CHROMATOGRAPHIC DETECTION SYSTEM USING A SILICON PHOTO-DIODE ARRAY [J].
AMITA, T ;
ICHISE, M ;
KOJIMA, T .
JOURNAL OF CHROMATOGRAPHY, 1982, 234 (01) :89-98
[2]  
Bach H., 1995, PROPERTIES OPTICAL G
[3]  
BRACKMANN U, 1986, LAMBDACHROME LASER D, P148
[4]   DETERMINATION OF DIELECTRIC PERMITTIVITY AND THICKNESS OF A METAL LAYER FROM A SURFACE-PLASMON RESONANCE EXPERIMENT [J].
DEBRUIJN, HE ;
KOOYMAN, RPH ;
GREVE, J .
APPLIED OPTICS, 1990, 29 (13) :1974-1978
[5]  
Earp RL, 1998, CHEM ANAL SERIES MON, V148, P99
[6]  
Gray D. E., 1972, AM I PHYSICS HDB, P3
[7]  
GRIOT M, 1995, CATALOG, P4
[8]   MULTIWAVELENGTH SURFACE-PLASMON RESONANCE AS AN OPTICAL SENSOR FOR CHARACTERIZING THE COMPLEX REFRACTIVE-INDEXES OF CHEMICAL-SAMPLES [J].
JORGENSON, RC ;
JUNG, C ;
YEE, SS ;
BURGESS, LW .
SENSORS AND ACTUATORS B-CHEMICAL, 1993, 14 (1-3) :721-722
[9]   SURFACE-PLASMON SENSOR FOR ABSORPTION-SENSITIVITY ENHANCEMENT [J].
KANO, H ;
KAWATA, S .
APPLIED OPTICS, 1994, 33 (22) :5166-5170
[10]   SIMULTANEOUS DETERMINATION OF REFRACTIVE-INDEX AND ABSORBENCY SPECTRA OF CHEMICAL-SAMPLES USING SURFACE-PLASMON RESONANCE [J].
KARLSEN, SR ;
JOHNSTON, KS ;
JORGENSON, RC ;
YEE, SS .
SENSORS AND ACTUATORS B-CHEMICAL, 1995, 25 (1-3) :747-749