Thin film water

被引：109

作者：

Ewing, GE ^{[1
]}

机构：

[1] Indiana Univ, Dept Chem, Bloomington, IN 47405 USA

来源：

JOURNAL OF PHYSICAL CHEMISTRY B | 2004年 / 108卷 / 41期

关键词：

D O I：

10.1021/jp040378+

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Thin film water is ubiquitous. It coats insulators, even ice, under ambient conditions. And the film can have a profound effect on the physical and chemical properties of the substrates it covers. The direct measurement of thin film water by infrared spectroscopy is described. Our studies can reveal film thicknesses, hydrogen bonding networks, thermodynamic properties, and molecular orientations. Recent examples of our research, with the focus on two model substrates, NaCl and ice, are discussed.

引用

收藏

页码：15953 / 15961

页数：9

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