Finite size effects in patterned magnetic permalloy films

被引:35
作者
Gubbiotti, G
Albini, L
Carlotti, G
De Crescenzi, M
Di Fabrizio, E
Gerardino, A
Donzelli, O
Nizzoli, F
Koo, H
Gomez, RD
机构
[1] Univ Perugia, INFM, Dipartimento Fis, I-06100 Perugia, Italy
[2] Univ Camerino, Dipartimento Matemat & Fis, INFM, I-62032 Camerino, Italy
[3] INFM, TASC, I-43100 Trieste, Italy
[4] IESS, I-00156 Rome, Italy
[5] Univ Ferrara, INFM, Dipartimento Fis, I-44100 Ferrara, Italy
[6] Univ Maryland, Dept Elect & Comp Engn, College Pk, MD 20742 USA
关键词
D O I
10.1063/1.372473
中图分类号
O59 [应用物理学];
学科分类号
摘要
Electron beam lithography has been used to prepare 250-A-thick square-shaped permalloy dots whose width and separation are in the range between 1 and 4 mu m. The static and dynamic magnetic properties of these structures have been investigated by complementary techniques such as magneto-optic Kerr effect (MOKE), magnetic force microscopy (MFM), and Brillouin light scattering (BLS). Longitudinal MOKE enabled us to compare the hysteresis loops of the specimens with different dot size and interdot separation, showing a marked influence of the demagnetizing field inside the dots. MFM images recorded at zero applied field showed that, depending on the interdot spacing, there is a prevalence of either four- or seven-domain patterns together with a minority of nonsolenoidal patterns that possess a net magnetic moment. BLS from thermally activated spin waves were then used to determine the intrinsic magnetic parameters of the permalloy films and to show evidence of the discretization of the spin-wave peak due to the wave vector resonance condition within each dot. (C) 2000 American Institute of Physics. [S0021-8979(00)38108-7].
引用
收藏
页码:5633 / 5635
页数:3
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