Optical characterization of photonic crystal delay lines based on one-dimensional coupled defects

被引：39

作者：

Nishikawa, S ^{[1
]}

Lan, S ^{[1
]}

Ikeda, N ^{[1
]}

Sugimoto, Y ^{[1
]}

Ishikawa, H ^{[1
]}

Asakawa, K ^{[1
]}

机构：

[1] Femtosecond Technol Res Assoc, Tsukuba, Ibaraki 3002635, Japan

来源：

OPTICS LETTERS | 2002年 / 27卷 / 23期

关键词：

D O I：

10.1364/OL.27.002079

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We performed optical characterizations of optical delay lines based on photonic crystal waveguides. The delay lines were composed of cylindrical air holes in silicon-on-silicon-dioxide ridge waveguides, defects were periodically created by means of increasing the separation of two neighboring air holes, and the structure was designed to have flat-transmittance impurity band. We clearly observed an impurity band with a bandwidth of similar to30 nm and a maximum transmittance of similar to0.5 at an operating wavelength of similar to1.55 mum. A 600-fs delay was confirmed with a 20-mum-long delay line. A good agreement was confirmed between the experimental results and the calculations. (C) 2002 Optical Society of America.

引用

页码：2079 / 2081

页数：3

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