Anode interfacial engineering approaches to enhancing anode/hole transport layer interfacial stability and charge injection efficiency in organic light-emitting diodes

The integrity of anode/organic interfacial contact is shown to be crucial to the performance and stability of archetypical small molecule organic light-emitting diodes (OLEDs). In this contribution, vapor-deposited lipophilic, hole-transporting 1,4-bis(phenyl-m-tolylamino)biphenyl (TPD) and 1,4-bis(1-naphthylphenylamino)biphenyl (NPB) thin films are shown to undergo decohesion on ITO anode surfaces under mild heating. An effective approach to ameliorate such interfacial decohesion is introduction, via self-assembly or spin-coating, of covalently bound N(p-C6H4CH2CH2CH2SiCl3)(3) (TAA)- and 4,4'-bis[(p-trichlorosilylpropylphenyl)phenylamino]biphenyl (TPD-Si-2)-derived adhesion/injection layers at the anode/hole transport layer interface. The resulting angstrom-scale hole transport layers prevent decohesion of vapor-deposited hole transport layers and significantly enhance OLED hole injection fluence. OLEDs fabricated with these modified interfaces exhibit appreciably reduced turn-on voltages, considerably higher luminous intensities, and enhanced thermal robustness versus bare ITO-based control devices. Spin-coated, cross-linked TPD-Si-2 films, in particular, prove to be superior to conventional ITO functionalization interlayers, including copper phthalocyanine, in this regard. The present ITO-functionalized devices achieve maximum external forward quantum efficiencies as high as 1.2% and a luminous level of 15 000 cd/m(2) in simple ITO/interlayer/ HTL/Alq/Al heterostfuctures. We also show that Cu(Pc) interlayers actually suppress, rather than enhance, hole injection and template crystallization of vapor-deposited TPD and NPB at modest temperatures, resulting in poor OLED thermal stability.