Ion implantation of diamond for electronic applications

被引:48
作者
Prins, JF [1 ]
机构
[1] Univ Pretoria, Dept Phys, ZA-0002 Gauteng, South Africa
关键词
D O I
10.1088/0268-1242/18/3/304
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Ion implantation studies on diamond have been reported for over 30 years. Initial claims of achieving doping in this way, probably related primarily to electrical effects caused by intrinsic radiation damage. Since then, a better understanding of defect creation and accumulation during ion implantation has emerged. This has made it possible to devise successful routes that enabled diamond to be doped p-type by boron-ion implantation. Limited success has also been achieved for phosphorus doping to generate n-type layers. Recent results indicate that it is possible to quench in shallow, metastable donor states using oxygen implantation. In this paper, an update is given on the present understanding of the inherent physical processes, and expected future trends when modifying the electronic properties of diamond by means of ion implantation.
引用
收藏
页码:S27 / S33
页数:7
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