Proximity templates for Modeling of skin and proximity effects on packages and high frequency interconnect

被引:9
作者
Daniel, L [1 ]
Sangiovanni-Vincentelli, A [1 ]
White, J [1 ]
机构
[1] MIT, Cambridge, MA 02139 USA
来源
IEEE/ACM INTERNATIONAL CONFERENCE ON CAD-02, DIGEST OF TECHNICAL PAPERS | 2002年
关键词
skin effect; proximity effect; parasitic extraction; interconnect analysis;
D O I
10.1109/ICCAD.2002.1167554
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Modeling the exponentially varying current distributions in conductor interiors associated with high frequency interconnect behavior causes a rapid increase in the computation time and memory required even by recently developed fast electromagnetic analysis programs. In this paper we describe a procedure to generate numerically a set of basis functions which efficiently represent conductor current variation, and thus improving solver efficiency. The method is based on solving a sequence of template problems, and is easily generalized to arbitrary conductor cross-sections. Results are presented to demonstrate that the numerically computed basis functions are seven to twenty times more efficient than the commonly used piece-wise constant basis functions.
引用
收藏
页码:326 / 333
页数:8
相关论文
共 19 条
[1]   Enhanced skin effect for partial-element equivalent-circuit (PEEC) models [J].
Coperich, KM ;
Ruehli, AE ;
Cangellaris, A .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2000, 48 (09) :1435-1442
[2]   Interconnect electromagnetic modeling using conduction modes as global basis functions [J].
Daniel, L ;
Sangiovanni-Vincentelli, A ;
White, J .
ELECTRICAL PERFORMANCE OF ELECTRONIC PACKAGING, 2000, :203-206
[3]  
DANIEL L, 2001, DES AUT C JUN
[4]  
Demmel J.W., 1997, APPL NUMERICAL LINEA
[5]  
Harrington R. F., 1968, FIELD COMPUTATION MO
[6]   FASTHENRY - A MULTIPOLE-ACCELERATED 3-D INDUCTANCE EXTRACTION PROGRAM [J].
KAMON, M ;
TSUK, MJ ;
WHITE, JK .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1994, 42 (09) :1750-1758
[7]  
Kamon M, 1997, 1997 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN - DIGEST OF TECHNICAL PAPERS, P456, DOI 10.1109/ICCAD.1997.643575
[8]   Large-scale capacitance calculation [J].
Kapur, S ;
Long, DE .
37TH DESIGN AUTOMATION CONFERENCE, PROCEEDINGS 2000, 2000, :744-749
[9]  
Marques N, 1998, 1998 DESIGN AUTOMATION CONFERENCE, PROCEEDINGS, P297, DOI 10.1109/DAC.1998.724486
[10]   FASTCAP - A MULTIPOLE ACCELERATED 3-D CAPACITANCE EXTRACTION PROGRAM [J].
NABORS, K ;
WHITE, J .
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1991, 10 (11) :1447-1459