Experimental (XPS/STM) and theoretical (FLAPW) studies of model systems M1/4TiS2 (M=Fe, Co, Ni):: influence of the inserted metal

被引：15

作者：

Martinez, H ^{[1
]}

Tison, Y ^{[1
]}

Baraille, I ^{[1
]}

Loudet, M ^{[1
]}

Gonbeau, D ^{[1
]}

机构：

[1] CNRS, LCTPCM, UMR 5624, F-64053 Pau 9, France

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 2002年 / 125卷 / 03期

关键词：

insertion; scanning tunneling microscopy (STM); x-ray photoelectron spectroscopy (XPS); core peaks; valence bands; calculated densities of states;

D O I：

10.1016/S0368-2048(02)00136-6

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

The effects of metal insertion (iron, cobalt and nickel) into 1T-CdI2-type TiS2 layered crystals, expressed as MxTiS2, have been studied by X-ray photoelectron spectroscopy (XPS), scanning tunneling microscopy (STM) and band structure calculations (FLAPW method). The stoichiometry x=1/4 was chosen because of specific crystallographic features of the compounds studied. We focused our interest on the role played by chalcogen atoms. S 2p core spectra are found to depend strongly on their chemical surroundings (Ti or Ti and M) and on the guest metal. We imaged the top sulfur plane (001) for Fe1/4TiS2, Co1/4TiS2 and Ni1/4TiS2 and note that the results also depend on the compound considered. Theoretical calculations have been carried out in order to improve our knowledge of the electronic structure of M1/4TiS2 compounds and attempts are made to rationalize the experimental data. (C) 2002 Elsevier Science B.V. All rights reserved.

引用

页码：181 / 196

页数：16

共 35 条

[1] XPS ANALYSIS OF OXIDE-REDUCTION MECHANISMS DURING LITHIUM INTERCALATION IN AMORPHOUS MOLYBDENUM OXYSULFIDE THIN-FILMS [J].