Simple X-ray dark- and bright-field imaging using achromatic lane optics

被引：85

作者：

Ando, M

Maksimenko, A

Sugiyama, H

Pattanasiriwisawa, W

Hyodo, K

Uyama, C

机构：

[1] High Energy Accelerator Res Org KEK, Inst Mat Struct Sci, Photon Factory, Tsukuba, Ibaraki 3050801, Japan

[2] Grad Univ Adv Studies GUAS, Sch Adv Studies, Dept Photo Sci, Miura, Kanagawa 2400193, Japan

[3] Grad Univ Adv Studies GUAS, Sch Phys Math, Dept Mat Struct Sci, Tsukuba, Ibaraki 3050801, Japan

[4] Hiroshima Int Univ, Fac Hlth Sci, Dept Clin Engn, Kamo, Hiroshima 7240695, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 2002年 / 41卷 / 9A-B期

关键词：

X-ray dark-field imaging; X-ray bright-field imaging; asymmetric monochromator; analyzer; refraction contrast; synchrotron radiation; silicon;

D O I：

10.1143/JJAP.41.L1016

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

dX-ray dark-field and bright-field imaging in the Laue geometry has been successfully demonstrated. Using a Bragg-case asymmetric monochromator that produces an X-ray beam with a 0.3 murad divergence incident onto an object and a Laue geometry analyzer that can simultaneously provide dark-field imaging (DFI) and bright-field imaging,(BFI). The DFI has only an X-ray refraction component on the object without illumination, while the BFI has reasonable illumination. This was achieved by a 1.075 mm thick silicon analyzer with 4, 4, 0 diffraction at 35 keV X-ray photon energy. An image of an insect embedded in polymethylmethacrylate, which can not be visualized by absorption, has been obtained.

引用

页码：L1016 / L1018

页数：3

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