Surface treatment of indium-tin-oxide substrates and its effects on initial nucleation processes of diamine films

被引:46
作者
Fujita, S
Sakamoto, T
Ueda, K
Ohta, K
Fujita, S
机构
[1] Dept. of Electron. Sci. and Eng., Kyoto University
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1997年 / 36卷 / 1A期
关键词
organic EL; ITO surface; surface treatment; AFM; work function; cohesion of TPD molecules; molecular configuration;
D O I
10.1143/JJAP.36.350
中图分类号
O59 [应用物理学];
学科分类号
摘要
The effects of several surface treatment techniques for indium-tin-oxide (ITO) substrates on the surface properties and the initial nucleation processes of trisphenyldiamine (TPD) have been investigated. Mechanical rubbing, HCl treatment, and O-2-plasma irradiation smoothen the ITO surface and enhance the cohesion of TPD molecules. As-received ITO surfaces promote amorphous structure of the TPD molecules; this results in effective carrier transport, but the substrate surface is too rough on a molecular scale for the fabrication of very thin (e.g., less than or equal to 200 Angstrom) layered structures. Layer-by-layer amorphous nucleation on flat surfaces is a key technology for the fabrication of future organic electroluminescence (EL) device structures with very thin constituent layers. O-2-plasma treatment reduces the potential barrier for hole injection from ITO to TPD with moderate cohesion of TPD molecules, and results in brighter EL devices than those on as-received ITO substrates.
引用
收藏
页码:350 / 353
页数:4
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