Alternating current losses in biaxially textured YBa2Cu3O7-delta films deposited on Ni tapes

被引:28
作者
Kerchner, HR
Norton, DP
Goyal, A
Budai, JD
Christen, DK
Kroeger, DM
Specht, ED
He, Q
Paranthaman, M
Lee, DF
Sales, BC
List, FA
Feenstra, R
机构
[1] Oak Ridge National Laboratory, Oak Ridge
关键词
D O I
10.1063/1.119777
中图分类号
O59 [应用物理学];
学科分类号
摘要
YBa2Cu3O7-delta films grown on rolling-assisted biaxially textured substrates carry critical current densities 10(5)-10(6) A/cm(2) at 77 K and low applied magnetic fields. In the low-field and low-current regime, ac transport current studies show hysteresis energy loss (per cycle and per unit length) roughly the value expected for a superconductor of elliptic cross section. The critical current I-c was deduced from observed de and dynamic current-voltage relations. The power loss rises sharply as I-0 (the maximum current in each cycle) is raised above I-c. In the present configuration, ferromagnetic hysteresis of the Ni substrate contributes little or no loss. (C) 1997 American Institute of Physics.
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页码:2029 / 2031
页数:3
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