High resolution atomic force microscopic imaging of the Si(111)-(7x7) surface: Contribution of short-range force to the images - art. no. 256105

被引：82

作者：

Eguchi, T ^{[1
]}

Hasegawa, Y ^{[1
]}

机构：

[1] Univ Tokyo, Inst Solid State Phys, Kashiwa, Chiba 2778581, Japan

来源：

PHYSICAL REVIEW LETTERS | 2002年 / 89卷 / 26期

关键词：

D O I：

10.1103/PhysRevLett.89.266105

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Observation of the rest-atom layer of the Si(111)-(7x7) surface is performed by atomic force microscopy. By detecting the force due to the single chemical covalent bond formed between the tip and the sample surface, individual atoms on the layer were clearly resolved. Unprecedented high spatial resolution was achieved by setting the detection force at a small value and by reducing background forces due to the long-range interactions with the small oscillation amplitude of the cantilever and sharp probe tip.

引用

页数：4

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