Highly charged ion based time-of-flight emission microscope

被引:11
作者
Hamza, AV [1 ]
Barnes, AV [1 ]
Magee, E [1 ]
Newman, M [1 ]
Schenkel, T [1 ]
McDonald, JW [1 ]
Schneider, DH [1 ]
机构
[1] Univ Calif Lawrence Livermore Natl Lab, Livermore, CA 94551 USA
关键词
D O I
10.1063/1.1150582
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
An emission microscope using highly charged ions as the excitation source has been designed, constructed, and operated. A novel "acorn" objective lens has been used to simultaneously image electron and secondary ion emission. A resistive anode-position sensitive detector is used to determine the x-y position and time of arrival of the secondary events at the microscope image plane. Contrast in the image can be based on the intensity of the electron emission and/or the presence of particular secondary ions. Spatial resolution of better than 1 mu m and mass resolution m/Delta m of better than 400 were demonstrated. Background rejection from uncorrelated events of greater than an order of magnitude is also achieved. (C) 2000 American Institute of Physics. [S0034-6748(00)03105-1].
引用
收藏
页码:2077 / 2081
页数:5
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