共 16 条
[2]
BARNES AJ, UNPUB
[3]
CASTIANG R, P EUR REG C EL MICR
[4]
DAHL DA, 1995, 43 ASMS C MASS SPECT, P717
[5]
DUKER H, 1960, Z METALLKD, V51, P314
[6]
GRIFFITH OH, 1991, ULTRAMICROSCOPY, V36, P1
[7]
Hamza AV, 1999, EUR PHYS J D, V6, P83
[8]
Secondary ion coincidence in highly charged ion based secondary ion mass spectroscopy for process characterization
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS,
1999, 17 (01)
:303-305
[9]
HAMZA AV, UNPUB
[10]
MCDONALD J, 1992, PHYS REV LETT, V46, P2297