共 96 条
- [1] ALISON JM, 1995, J PHYS D, V28, P1
- [3] ALLEN JW, 1991, J LUMIN, V49, P18
- [4] [Anonymous], 1967, EUR POLYM J
- [5] DEGRADATION OF POLYMERIC INSULATION DUE TO PHOTOEMISSION CAUSED BY HIGH ELECTRIC-FIELDS [J]. IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1989, 24 (01): : 91 - 98
- [6] BAMJI SS, 1991, PROCEEDINGS OF THE 3RD INTERNATIONAL CONFERENCE ON PROPERTIES AND APPLICATIONS OF DIELECTRIC MATERIALS, VOLS 1 AND 2, P51, DOI 10.1109/ICPADM.1991.172352
- [7] DEGRADATION MECHANISM AT XLPE SEMICON INTERFACE SUBJECTED TO HIGH ELECTRICAL STRESS [J]. IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1991, 26 (02): : 278 - 284
- [8] THRESHOLD VOLTAGE FOR ELECTRICAL TREE INCEPTION IN UNDERGROUND HV TRANSMISSION CABLES [J]. IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1992, 27 (02): : 402 - 404
- [9] THE ROLE OF POLYMER INTERFACE DURING TREE INITIATION IN LDPE [J]. IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1986, 21 (04): : 639 - 644