Magnetic resonance force microscopy with a permanent magnet on the cantilever

被引:11
作者
Zhang, Z
Hammel, PC
机构
[1] Los Alamos National Laboratory, Los Alamos
关键词
D O I
10.1109/20.619658
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
When the variation of the bias field is on the order of a few hundred gauss, permanent magnetic microparticles of Nd2Fe14B (NdFeB) mounted on atomic force microscopy (AFM) cantilevers generate much smaller nonresonance (NR) signals in the magnetic resonance force microscopy (MRFM) spectra than most soft magnetic thin films. However, the interactions of the NdFeB particle with the bias field cause an undesirable variation of the cantilever resonance frequency with changing bias field, Our model indicates the importance of minimizing the polarized moment of the magnetic tip and ensuring that the applied fields employed in the MRFM experiment be highly uniform.
引用
收藏
页码:4047 / 4049
页数:3
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