Microscopic imaging and holography with hard X-rays using Fresnel zone-plates

被引:27
作者
Leitenberger, W [1 ]
Weitkamp, T [1 ]
Drakopoulos, M [1 ]
Snigireva, I [1 ]
Snigirev, A [1 ]
机构
[1] European Synchrotron Radiat Facil, ESRF, Expt Div, F-38043 Grenoble, France
关键词
X-ray microscopy; X-ray holography; coherent X-rays; X-ray imaging; Fresnel zone-plate; synchrotron radiation;
D O I
10.1016/S0030-4018(00)00710-0
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The imaging properties of a Fresnel zone-plate (FZP) were used for magnified imaging of microobjects using hard X-rays. The experiments were done using 14 keV synchrotron radiation, The coherence properties of the radiation produced by an undulator allowed the recording of real images and holograms from an object in one single exposure. These images result from the positive and the negative first order diffracted beams respectively. The X-ray microscope worked at an X-ray magnification factor of 12 and could resolve structures of 0.3 mu m in size, By going to slightly defocused conditions we obtained magnified images of the holographical nearfield diffraction pattern (in-line holograms) of the object, (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:233 / 238
页数:6
相关论文
共 22 条
[1]  
[Anonymous], PRINCIPLES OPTIC
[2]  
Aristov V. V., 1986, AIP Conference Proceedings, P253, DOI 10.1063/1.35995
[3]  
Attwood D., 1999, SOFT XRAYS EXTREME U
[4]   PHASE-CONTRAST IMAGING OF WEAKLY ABSORBING MATERIALS USING HARD X-RAYS [J].
DAVIS, TJ ;
GAO, D ;
GUREYEV, TE ;
STEVENSON, AW ;
WILKINS, SW .
NATURE, 1995, 373 (6515) :595-598
[5]   Submicrometre resolution phase-contrast radiography with the beam from an X-ray waveguide [J].
Di Fonzo, S ;
Jark, W ;
Soullie, G ;
Cedola, A ;
Lagomarsino, S ;
Cloetens, P ;
Riekel, C .
JOURNAL OF SYNCHROTRON RADIATION, 1998, 5 :376-378
[6]   On x-ray phase imaging with a point source [J].
Gureyev, TE ;
Wilkins, SW .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1998, 15 (03) :579-585
[7]   Feasibility of transmission x-ray microscopy at 4 keV with spatial resolutions below 150 nm [J].
Kaulich, B ;
Oestreich, S ;
Salome, M ;
Barrett, R ;
Susini, J ;
Wilhein, T ;
Di Fabrizio, E ;
Gentili, M ;
Charalambous, P .
APPLIED PHYSICS LETTERS, 1999, 75 (26) :4061-4063
[8]   X-ray imaging with submicrometer resolution employing transparent luminescent screens [J].
Koch, A ;
Raven, C ;
Spanne, P ;
Snigirev, A .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1998, 15 (07) :1940-1951
[9]   DEVELOPMENT OF A HARD X-RAY-IMAGING MICROSCOPE [J].
LAI, B ;
YUN, W ;
XIAO, Y ;
YANG, L ;
LEGNINI, D ;
CAI, Z ;
KRASNOPEROVA, A ;
CERRINA, F ;
DIFABRIZIO, E ;
GRELLA, L ;
GENTILI, M .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (02) :2287-2289
[10]   HARD X-RAY PHASE ZONE PLATE FABRICATED BY LITHOGRAPHIC TECHNIQUES [J].
LAI, B ;
YUN, WB ;
LEGNINI, D ;
XIAO, Y ;
CHRZAS, J ;
VICCARO, PJ ;
WHITE, V ;
BAJIKAR, S ;
DENTON, D ;
CERRINA, F ;
DIFABRIZIO, E ;
GENTILI, M ;
GRELLA, L ;
BACIOCCHI, M .
APPLIED PHYSICS LETTERS, 1992, 61 (16) :1877-1879