Quantitative magnetization measurements on nanometer ferromagnetic cobalt wires using electron holography

被引：39

作者：

Snoeck, E

Dunin-Borkowski, RE

Dumestre, F

Renaud, P

Amiens, C

Chaudret, B

Zurcher, P

机构：

[1] Univ Cambridge, Dept Mat Sci & Met, Cambridge CB2 3QZ, England

[2] CNRS, CEMES, F-31055 Toulouse, France

[3] Motorola Inc, Semicond Prod Sector, Digital DNA Labs, F-31023 Toulouse, France

[4] CNRS, LCC, F-31055 Toulouse, France

[5] Motorola Inc, Semicond Prod Sector, Digital DNA Labs, Tempe, AZ 85824 USA

来源：

APPLIED PHYSICS LETTERS | 2003年 / 82卷 / 01期

关键词：

D O I：

10.1063/1.1532754

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The magnetic remanent states of 4-nm-diameter single-crystalline Co nanowires are characterized using off-axis electron holography. Measurements are obtained from isolated wires, as well as from bundles of wires and "multibranch" wires joined by 15-nm-diameter nodes of Co. The fraction of magnetically active moments in a single 4-nm-diameter wire is measured to be 1.01+/-0.19, indicating that, to within experimental error, the wire is fully magnetized throughout its diameter. (C) 2003 American Institute of Physics.

引用

页码：88 / 90

页数：3

共 20 条

[1] Measurement of the remanent magnetization of single Co/Cu and Ni nanowires by off-axis TEM electron holography [J].