Position sensitive x-ray spectrophotometer using microwave kinetic inductance detectors

被引：78

作者：

Mazin, Benjamin A.

Bumble, Bruce

Day, Peter K.

Eckart, Megan E.

Golwala, Sunil

Zmuidzinas, Jonas

Harrison, Fiona A.

机构：

[1] CALTECH, Jet Prop Lab, Pasadena, CA 91109 USA

[2] CALTECH, Dept Phys, Pasadena, CA 91125 USA

来源：

APPLIED PHYSICS LETTERS | 2006年 / 89卷 / 22期

基金：

美国国家航空航天局;

关键词：

D O I：

10.1063/1.2390664

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The surface impedance of a superconductor changes when energy is absorbed and Cooper pairs are broken to produce single electron (quasiparticle) excitations. This change may be sensitively measured using a thin-film resonant circuit called a microwave kinetic inductance detector (MKID). The practical application of MKIDs for photon detection requires a method of efficiently coupling the photon energy to the MKID. The authors present results on position sensitive x-ray detectors made by using two aluminum MKIDs on either side of a tantalum photon absorber strip. Diffusion constants, recombination times, and energy resolution are reported. MKIDs can easily be scaled into large arrays. (c) 2006 American Institute of Physics.

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页数：3

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