The role of an energy-dependent inner potential in quantitative low-energy electron diffraction

被引：31

作者：

Walter, S

Blum, V

Hammer, I

Müller, S

Heinz, K

Giesen, M

机构：

[1] Univ Erlangen Nurnberg, Lehrstuhl Festkorperphys, D-91058 Erlangen, Germany

[2] Forschungszentrum Julich, Inst Grenzflachenforsch & Vakuumphys, D-52425 Julich, Germany

来源：

SURFACE SCIENCE | 2000年 / 458卷 / 1-3期

关键词：

copper; low energy electron diffraction (LEED); low index single crystal surfaces; surface structure; morphology; roughness; and topography;

D O I：

10.1016/S0039-6028(00)00433-7

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Recent apparent discrepancies between results from low-energy electron and X-ray diffraction concerning a reduced in-plane lattice parameter of Cu(100) are resolved in favour of an uncontracted surface. We show that neglecting the energy dependence of the inner potential in the electron intensity analysis simulates reduced structural parameters when a precision level of about 0.01 Angstrom is reached. As today this level is frequently claimed, our finding is of general relevance, in particular when the in-plane lattice parameter is not precisely known, as in epitaxial growth, for example. (C) 2000 Elsevier Science B.V. All rights reserved.

引用

页码：155 / 161

页数：7

共 32 条

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[2]

BAUER R, 1989, THESIS ERLANGEN

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