An other way to assess electronics part reliability

被引：2

作者：

Charpenel, P ^{[1
]}

Cavernes, P ^{[1
]}

Borowski, J ^{[1
]}

Chopin, JM ^{[1
]}

机构：

[1] GIAT IND,F-31052 TOULOUSE,FRANCE

来源：

MICROELECTRONICS AND RELIABILITY | 1997年 / 37卷 / 10-11期

关键词：

D O I：

10.1016/S0026-2714(97)00084-X

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents a framework to assess electronics part reliability in embedded applications, using a deterministic approach. The analyze of the results of the reliability tests performed by the COTS manufacturers casing known physical laws allows to determine a failure rate. The good accordance between this deterministic approach and field data is shown, whereas the inadequacy of classical prediction methods is confirmed. (C) 1997 Elsevier Science Ltd.

引用

页码：1449 / 1452

页数：4