1-D scanning arrays on dense dielectrics using PCS-EBG technology

We show how the design of integrated arrays can significantly benefit from planar circularly symmetric (PCS) electromagnetic band gap (EBG) structures. Using this technology, a phased array that scans up to 40 degrees in one dimension and that is characterized by relatively large bandwidth (BW approximate to 15%) is designed, manufactured and tested. The specific advantages coming from the use of PCS-EBGs are two fold. On one hand the losses associated to surface waves are significantly reduced. On the other hand each element of the array has a larger effective area that leads to a higher gain for the complete array when compared with a standard technology. Additional benefits are the low cross-polarization levels, the good front to back ratio considering that the antenna does not include a backing reflector, and the low profile.