Investigation of the carbon nanotube AFM tip contacts: free sliding versus pinned contact

被引:15
作者
Buchoux, Julien [1 ]
Aime, Jean-Pierre [1 ]
Boisgard, Rodolphe [1 ]
Nguyen, Cattien V. [2 ]
Buchaillot, Lionel [3 ]
Marsaudon, Sophie [1 ]
机构
[1] Univ Bordeaux 1, CPMOH 351, Cours Liberat, F-33405 Talence, France
[2] NASA, Ames Res Ctr, ELORET Corp, Moffett Field, CA 94035 USA
[3] IEMN, ISEN Dept, F-59652 Villeneuve Dascq, France
关键词
FORCE MICROSCOPE CANTILEVERS; MECHANICAL-PROPERTIES; LATERAL RESOLUTION; YOUNGS MODULUS; SCANNING PROBE; NANOMECHANICS; COMPRESSION;
D O I
10.1088/0957-4484/20/47/475701
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Mechanical response of carbon nanotube atomic force microscope probes are investigated using a thermal noise forcing. Thermal noise spectra are able to investigate mechanical behaviors that cannot be studied using classical atomic force microscope modes. Experimental results show that the carbon nanotube contacts can be classified in two categories: the free sliding and pinned cases. The pinned contact case requires the description of the cantilever flexural vibrations with support spring-coupled cantilever boundary conditions. Our experimental results show that carbon nanotubes exhibit different contact behaviors with a surface, and in turn different mechanical responses.
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页数:8
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