Negative refraction imaging in a hybrid photonic-crystal device at near-infrared frequencies

被引：21

作者：

Lu, Zhaolin ^{[1
]}

Miao, Binglin

Hodson, Timothy R.

Lin, Chunchen

Murakowski, Janusz A.

Prather, Dennis W.

机构：

[1] Rochester Inst Technol, Kate Gleason Coll Engn, Rochester, NY 14623 USA

[2] Univ Delaware, Dept Elect & Comp Engn, Newark, DE 19716 USA

来源：

OPTICS EXPRESS | 2007年 / 15卷 / 03期

关键词：

12;

D O I：

10.1364/OE.15.001286

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We present the experimental demonstration of imaging of a point source by negative refraction at near-infrared frequencies using a hybrid photonic crystal device. The photonic crystal device, fabricated by patterning holes in 260nm silicon-on-insulator, integrates a triangular-lattice photonic crystal with a large photonic bandgap and square-lattice photonic crystal with negative refraction. Experimental results show that the output of a line-defect photonic bandgap waveguide provides a nearly ideal point source and then is imaged through the photonic crystal by negative refraction. (c) 2007 Optical Society of America.

引用

页码：1286 / 1291

页数：6

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