Estimation of useful yield in surface analysis using single photon ionisation

被引：22

作者：

King, BV ^{[1
]}

Pellin, MJ

Moore, JF

Veryovkin, IV

Savina, MR

Tripa, CE

机构：

[1] Univ Newcastle, Sch Math & Phys Sci, Callaghan, NSW 2308, Australia

[2] Argonne Natl Lab, Argonne, IL 60439 USA

来源：

APPLIED SURFACE SCIENCE | 2003年 / 203卷

关键词：

postionisation; laser desorption; SIMS; SAM; useful yield;

D O I：

10.1016/S0169-4332(02)00636-0

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Secondary ion mass spectrometry (SIMS), laser sputter neutral mass spectrometry (SNMS) and laser desorption photo-ionisation (LDPI) have been used to investigate the desorption of molecules from self-assembled monolayers of phenylsulphides. LDPI, using an F-2 excimer laser to single photon ionise gave the lowest fragmentation. A useful yield greater than 0.5% was found for analysis of diphenyldisulphide self-assembled monolayers. It is shown that using a free electron laser to postionise will lead, in the future, to analysis of many atoms and molecules with useful yields approaching 30%. (C) 2002 Elsevier Science B.V. All rights reserved.

引用

页码：244 / 247

页数：4

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