Dependence of exchange coupling on the surface roughness and structure in α-Fe2O3/NiFe and NiFe/α-Fe2O3 bilayers

被引:23
作者
Bae, S [1 ]
Judy, JH
Egelhoff, WF
Chen, PJ
机构
[1] Univ Minnesota, MINT, Minneapolis, MN 55455 USA
[2] NIST, Magnet Mat Grp, Gaithersburg, MD 20899 USA
关键词
D O I
10.1063/1.372799
中图分类号
O59 [应用物理学];
学科分类号
摘要
The exchange coupling characteristics for both Si/alpha-Fe2O3/NiFe and Si/NiFe/alpha-Fe2O3 bilayers have been investigated. These two bilayers showed completely different exchange coupling characteristics. The Si/alpha-Fe2O3 (50 nm)/NiFe(5 nm) bilayer had H-ex=62.5 Oe, H-c=137.5 Oe, while the Si/NiFe(5 nm)/alpha-Fe2O3(50 nm) bilayer had H-ex=4.5 Oe, H-c=9.5 Oe. The larger exchange bias field of alpha-Fe2O3/NiFe bilayer was mainly attributed to good crystallinity of alpha-Fe2O3 and the smooth interface between NiFe and alpha-Fe2O3. The interfacial exchange energy, J(ex) was also calculated for these two bilayers. The case of the rougher surface of bilayer (Si/NiFe/alpha-Fe2O3) exhibited smaller interfacial exchange energy. In order to verify the effect of alpha-Fe2O3 crystal structure on the exchange bias coupling characteristics, Ti (hcp), Zr (hcp), Ta (bcc), and Cu (fcc) were used as buffer layers for the Si/buffer layer/alpha-Fe2O3/NiFe structures. Ti and Zr buffer layers showed good exchange coupling performance, which was strongly related to good crystal matching with alpha-Fe2O3, but there was no exchange coupling improvement in the case of Ta and Cu buffer layers. (C) 2000 American Institute of Physics. [S0021-8979(00)93808-8].
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页码:6650 / 6652
页数:3
相关论文
共 5 条
[1]   MAGNETORESISTANCE OF SYMMETRICAL SPIN-VALVE STRUCTURES [J].
ANTHONY, TC ;
BRUG, JA .
IEEE TRANSACTIONS ON MAGNETICS, 1994, 30 (06) :3819-3821
[2]   EFFECTS OF TEMPERATURE ON EXCHANGE COUPLED ALLOYS OF NI80FE20-FEMN, NI80FE20-ALPHA-FE2O3, AND NI80FE20-TBCO [J].
CAIN, WC ;
MEIKLEJOHN, WH ;
KRYDER, MH .
JOURNAL OF APPLIED PHYSICS, 1987, 61 (08) :4170-4172
[3]   GIANT MAGNETORESISTANCE IN SOFT FERROMAGNETIC MULTILAYERS [J].
DIENY, B ;
SPERIOSU, VS ;
PARKIN, SSP ;
GURNEY, BA ;
WILHOIT, DR ;
MAURI, D .
PHYSICAL REVIEW B, 1991, 43 (01) :1297-1300
[4]  
SAKAKIMA H, 1999, INT 99 SEOUL
[5]   Exchange coupling between NiO and NiFe thin films [J].
Shen, JX ;
Kief, MT .
JOURNAL OF APPLIED PHYSICS, 1996, 79 (08) :5008-5010