Lattice Monte Carlo models of thin film deposition

被引:123
作者
Gilmer, GH
Huang, HC
de la Rubia, TD
Dalla Torre, J
Baumann, F
机构
[1] Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA
[2] Univ Calif Lawrence Livermore Natl Lab, Livermore, CA 94550 USA
基金
美国国家科学基金会;
关键词
lattice Monte Carlo models; thin film deposition; crystal growth;
D O I
10.1016/S0040-6090(99)01057-3
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Monte Carlo models of crystal growth have contributed to the theoretical understanding of thin film deposition, and are now becoming available as tools to assist in device fabrication. Because they combine efficient computation and atomic-level detail, these models can be applied to a large number of crystallization phenomena. They have played a central role in the understanding of the surface roughening transition and its effect on crystal growth kinetics. Ln addition, columnar growth, vacancy and impurity trapping, and other growth phenomena that are closely related to atomic-level structure have been investigated by these simulations. in this chapter we review some of these applications and discuss MC modeling of sputter deposition based on materials parameters derived from first principles and molecular dynamics methods. We discuss models of deposition which include the atomic scale, but can also simulate film structure evolution on time scales of the order of hours. By the use of advanced computers and algorithms, we can now simulate systems large enough to exhibit clustered, columnar, and polycrystalline film structures. The event distribution is determined from molecular dynamics simulations, which can give diffusion rates, defect production, sputtering yields, and other information needed to match real materials. We discuss simulations of deposition into small vias and trenches, and their extension to the length scale of real devices through scaling relations. (C) 2000 Published by Elsevier Science S.A. All rights reserved.
引用
收藏
页码:189 / 200
页数:12
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