Conflicting criteria in embedded system design

被引：27

作者：

Eisenring, M ^{[1
]}

Thiele, L ^{[1
]}

Zitzler, E ^{[1
]}

机构：

[1] Swiss Fed Inst Technol, Comp Engn & Networks Lab, CH-8092 Zurich, Switzerland

来源：

IEEE DESIGN & TEST OF COMPUTERS | 2000年 / 17卷 / 02期

关键词：

D O I：

10.1109/54.844334

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

This article presents a methodology to cope with the simultaneous optimization of multiple competing objectives and the different sources of heterogeneity in embedded system design.

引用

页码：51 / 59

页数：9

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