Unusual strain relaxation in Cu thin films on Ni(001)

被引：17

作者：

Rasmussen, FB ^{[1
]}

Baker, J ^{[1
]}

Nielsen, M ^{[1
]}

Feidenhansl, R ^{[1
]}

Johnson, RL ^{[1
]}

机构：

[1] UNIV HAMBURG,INST EXPT PHYS 2,D-22761 HAMBURG,GERMANY

来源：

PHYSICAL REVIEW LETTERS | 1997年 / 79卷 / 22期

关键词：

D O I：

10.1103/PhysRevLett.79.4413

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Surface x-ray diffraction has been used to study the growth of thin Cu films on Ni(001). We give direct evidence for the formation of embedded wedges with internal {111} facets in the film, as recently suggested by Muller et al. [Phys. Rev. Lett. 76, 2358 (1996)]. The unusual strain distribution within the wedges is determined and provides an explanation to the observed sudden change in growth and film morphology around 20 monolayers.

引用

页码：4413 / 4416

页数：4

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