Dual-trap technique for reduction of low-frequency noise in force measuring optical tweezers

被引：15

作者：

Klein, Markus ^{[1
]}

Andersson, Magnus ^{[1
]}

Axner, Ove ^{[1
]}

Fallman, Erik ^{[1
]}

机构：

[1] Umea Univ, Dept Phys, SE-90187 Umea, Sweden

来源：

APPLIED OPTICS | 2007年 / 46卷 / 03期

关键词：

D O I：

10.1364/AO.46.000405

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

High-resolution long-time force measurements by optical tweezers are often limited by low-frequency (1/f) noise. A dual-trap technique is presented that can reduce such noise in the force signal. It incorporates a second trap (a reference trap) that probes the noise in the system and it is based upon the assumption that the low-frequency parts of the noise from the two traps are correlated. A subtraction of the low-frequency signal from the reference trap from the signal from the force measuring trap will therefore yield a net signal that is significantly less influenced by noise. It is shown that this dual-trap technique can reduce the noise in the force signal up to 60% depending on detection bandwidth. (c) 2007 Optical Society of America

引用

页码：405 / 412

页数：8

共 30 条

[1] Direct observation of base-pair stepping by RNA polymerase [J].