Role of wire imperfections in micromagnetic traps for atoms -: art. no. 042629

被引：103

作者：

Estève, J

Aussibal, C

Schumm, T

Figl, C

Mailly, D

Bouchoule, I

Westbrook, CI

Aspect, A

机构：

[1] Inst Opt, Lab Charles Fabry, CNRS, UMR 8501, F-91403 Orsay, France

[2] Lab Photon & Nanostruct, CNRS, UPR 20, F-91460 Marcoussis, France

[3] Leibniz Univ Hannover, D-30167 Hannover, Germany

来源：

PHYSICAL REVIEW A | 2004年 / 70卷 / 04期

关键词：

D O I：

10.1103/PhysRevA.70.043629

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We present a quantitative study of roughness in the magnitude of the magnetic field produced by a current carrying microwire, i.e., in the trapping potential for paramagnetic atoms. We show that this potential roughness arises from deviations in the wire current flow due to geometric fluctuations of the edges of the wire: a measurement of the potential using cold trapped atoms agrees with the potential computed from the measurement of the wire edge roughness by a scanning electron microscope.

引用

页码：043629 / 1

页数：4

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