Formation of low-resistance ohmic contacts between carbon nanotube and metal electrodes by a rapid thermal annealing method

被引:146
作者
Lee, JO [1 ]
Park, C
Kim, JJ
Kim, J
Park, JW
Yoo, KH
机构
[1] Chonbuk Natl Univ, Dept Phys, Chonju 561756, South Korea
[2] Korea Res Inst Stand & Sci, Elect Grp, Taejon 305600, South Korea
关键词
Carbon - Current voltage characteristics - Electric properties - Electric resistance - Electrodes - Energy gap - Gold - Nanotubes - Optical microscopy - Rapid thermal annealing - Scanning electron microscopy - Titanium;
D O I
10.1088/0022-3727/33/16/303
中图分类号
O59 [应用物理学];
学科分类号
摘要
The contact resistance between a carbon nanotube and metal electrodes decreases by several orders of magnitude and becomes long-term stable when the nanotube contacted by Ti-Au electrodes was annealed by a rapid thermal annealing method at 600-800 degrees C for 30 s. The contact resistances of the annealed samples are in the range 0.5-50 k Omega at room temperature, depending on the electrical properties of the nanotube. The short and relatively low-temperature annealing process enables us to make a surface Ti-nanotube contact suitable for electrical measurements. For the samples with relatively low contact resistances (0.5-5 k Omega) at room temperature, the contact resistance remained constant or decreased slightly as the temperature was lowered. Those with a relatively high contact resistance (5-50 k Omega), on the other hand, showed increasing contact resistance with a lowering of the temperature.
引用
收藏
页码:1953 / 1956
页数:4
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