Modeling of light scattering from micro- and nanotextured surfaces

被引：116

作者：

Domine, D. ^{[1
]}

Haug, F. -J. ^{[1
]}

Battaglia, C. ^{[1
]}

Ballif, C. ^{[1
]}

机构：

[1] EPFL, Inst Microengn IMT, Photovolta & Thin Film Elect Lab, CH-2000 Neuchatel, Switzerland

来源：

JOURNAL OF APPLIED PHYSICS | 2010年 / 107卷 / 04期

关键词：

II-VI semiconductors; light scattering; light transmission; refractive index; silicon; solar cells; surface morphology; thin film devices; wide band gap semiconductors; zinc compounds; SILICON SOLAR-CELLS; SCALAR DIFFRACTION THEORY; ROUGHNESS; TCO;

D O I：

10.1063/1.3295902

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We present a calculation routine for the angular and spectral dependence of scattered light after transmission through textured interfaces. Based on a modified Rayleigh-Sommerfeld integral, the treatment requires only measured surface profiles, and the refractive indices of the two materials adjacent to the textured interface but no fitting parameter. For typical surface morphologies used in solar cell fabrication, the calculations correctly reproduce the angle resolved scattering at 543 nm and the total scattered light intensity in the spectral range from 400 to 2000 nm. The model is then applied to predict the behavior of the interface between ZnO and silicon in a thin film solar cell which is not experimentally accessible.

引用

页数：8

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