Error compensation for a three-dimensional shape measurement system

被引：24

作者：

Huang, PS ^{[1
]}

Hu, QY

Chiang, FP

机构：

[1] SUNY Stony Brook, Dept Mech Engn, Stony Brook, NY 11794 USA

[2] GE Co, GRC Appl Opt Lab, Schenectady, NY 12301 USA

来源：

OPTICAL ENGINEERING | 2003年 / 42卷 / 02期

基金：

美国国家科学基金会;

关键词：

error compensation; phase shifting; interpolation; 3-D shape measurement;

D O I：

10.1117/1.1531636

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We present an error compensation method for a full-field 3-D shape measurement system based on a digital fringe projection and phase shifting technique. The error map of the system is first established by comparing the measured coordinates with the coordinates defined by a coordinates measuring machine (CMM) at preselected sample points within the measurement volume. An eight-point interpolation algorithm based on the Shepard's method is then used to compensate for the errors in the measured coordinates. Experimental results showed that the accuracy of the system was improved by more than 60% after error compensation. (C) 2003 Society of Photo-Optical Instrumentation Engineers.

引用

页码：482 / 486

页数：5

共 7 条

[1]

ALFELD P, 1989, INT S NUM M, V90, P1

[2] Calibration of a 3-D surface contouring and ranging system [J].

Hu, QY ;

Huang, PSS ;

Fu, QL ;

Chiang, FP .

THREE-DIMENSIONAL IMAGING, OPTICAL METROLOGY, AND INSPECTION V, 1999, 3835 :158-166

[3] ONLINE ERROR COMPENSATION OF COORDINATE MEASURING MACHINES [J].

HUANG, PS ;

NI, J .

INTERNATIONAL JOURNAL OF MACHINE TOOLS & MANUFACTURE, 1995, 35 (05) :725-738

[4] Double three-step phase-shifting algorithm [J].

Huang, PS ;

Hu, QYJ ;

Chiang, FP .

APPLIED OPTICS, 2002, 41 (22) :4503-4509

[5] Use of a 'look-up' table improves the accuracy of a low-cost resolver-based absolute shaft encoder [J].

Kaul, SK ;

Koul, R ;

Bhat, CL ;

Kaul, IK ;

Tickoo, AK .

MEASUREMENT SCIENCE AND TECHNOLOGY, 1997, 8 (03) :329-331

[6] Estimation and compensation of subpixel edge localization error [J].

Pedersini, F ;

Sarti, A ;

Tubaro, S .

IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 1997, 19 (11) :1278-1284

[7] Error compensation by model-based interferometry [J].

Pfeifer, T ;

Mischo, H ;

Evertz, J ;

Manekeller, S .

MEASUREMENT SCIENCE AND TECHNOLOGY, 1998, 9 (07) :1137-1141

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