Determination of oxygen atomic positions in a Ga-In-Sn-O ceramic using direct methods and electron diffraction

被引：25

作者：

Sinkler, W

Marks, LD

Edwards, DD

Mason, TO

Poeppelmeier, KR

Hu, Z

Jorgensen, JD

机构：

[1] Northwestern Univ, Dept Mat Sci & Engn, Evanston, IL 60208 USA

[2] Argonne Natl Lab, Argonne, IL 60439 USA

[3] Northwestern Univ, Dept Chem, Evanston, IL 60208 USA

来源：

JOURNAL OF SOLID STATE CHEMISTRY | 1998年 / 136卷 / 01期

关键词：

D O I：

10.1006/jssc.1998.7804

中图分类号：

O61 [无机化学];

学科分类号：

070301 ; 081704 ;

摘要：

Direct methods using dynamical transmission electron diffraction (TED) intensities is applied to the solution of (Ga,In)(2)SnO5. Dynamical diffraction effects in the TED data lead to an emphasis of oxygen positions in the structure. Application of direct methods to dynamical diffraction intensities represents a valuable new technique for obtaining approximate atom positions of light elements in ceramics using an experiment which is simple to perform and does not require a single crystal. (C) 1998 Academic Press.

引用

页码：145 / 149

页数：5

共 19 条

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