Microstructures and oxygen diffusion at the LaMnO3 film/yttria-stabilized zirconia interface

被引：25

作者：

Horita, T

Tsunoda, T

Yamaji, K

Sakai, N

Kato, T

Yokokawa, H

机构：

[1] Natl Inst AIST, Tsukuba Cent 5, Energy Elect Inst,Fuel Cell Grp, Tsukuba, Ibaraki 3058565, Japan

[2] Natl Inst AIST, Tsukuba Cent 5, Mat & Chem Proc Inst, Tsukuba, Ibaraki 3058565, Japan

来源：

SOLID STATE IONICS | 2002年 / 152卷

关键词：

LaMnO3; film; YSZ; microstructure; interface; oxygen diffusion; SOFCs; SIMS;

D O I：

10.1016/S0167-2738(02)00367-3

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Microstructures and oxygen diffusion were investigated at the LaMnO3 film/Y2O3-stabilized ZrO2 (YSZ) interface by transmission electron microscopy (TEM), atomic force microscopy (AFM) and secondary ion mass spectrometry (SIMS) analysis for samples after heat treatments and isotope oxygen exchange (O-16/O-18 exchange) experiments. In "as-deposited LaMnO3 film" on YSZ, the O-18-diffusion profile showed a significant decrease in O-18 concentration near the LaMnO3 film/ YSZ interface, which corresponds to an amorphous layer. The heat treatment diminished the amorphous layer at the LaMnO3 film/YSZ interface. In the heat-treated sample (1473 K for 5 h), the O-18-diffusion profile in the LaMnO3 film showed gradual decrease and a subsequent minimum of the O-18 concentration at the LaMnO3/YSZ interface. This is due to the grain growth of lanthanum manganite, which provides the shorter paths to YSZ. (C) 2002 Elsevier Science B.V. All rights reserved.

引用

页码：439 / 446

页数：8

共 22 条

[1] OXYGEN REDUCTION AT LA0.5SR0.5MNO3 THIN-FILM YTTRIA-STABILIZED ZIRCONIA INTERFACE STUDIED BY IMPEDANCE SPECTROSCOPY [J].