Evolution of the Seebeck coefficient during the formation and crystallization of pyrite thin films

被引：38

作者：

Ares, JR ^{[1
]}

Leon, M ^{[1
]}

Arozamena, NM ^{[1
]}

Sanchez-Paramo, J ^{[1
]}

Celis, P ^{[1
]}

Ferrer, IJ ^{[1
]}

Sanchez, C ^{[1
]}

机构：

[1] Univ Autonoma Madrid, Dept Fis Mat 104, E-28049 Madrid, Spain

来源：

JOURNAL OF PHYSICS-CONDENSED MATTER | 1998年 / 10卷 / 19期

关键词：

D O I：

10.1088/0953-8984/10/19/015

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Pyrite thin films have been grown by sulphuration of Fe thin films and their Seebeck coefficient has been measured as a function of the sulphuration temperature in the range 370-720 K. Films appear to be p-type (positive Seebeck coefficient) for sulphuration temperatures higher than 450 K The evolution of the coefficient with the sulphuration temperature has been qualitatively correlated with the crystallization process that the films suffer on increasing that temperature. According to our analysis, the highest value of the Seebeck coefficient obtained in our measurements (S approximate to 80 mu V K-1) should correspond to non-stoichiometric crystallized pyrite films formed by spheroidal grains.

引用

页码：4281 / 4289

页数：9

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