Optical and structural properties of two-sourced evaporated ZnTe thin films

被引：66

作者：

Aqili, AKS ^{[1
]}

Ali, Z ^{[1
]}

Maqsood, A ^{[1
]}

机构：

[1] Quaid I Azam Univ, Dept Phys, Thermal Phys Lab, Islamabad, Pakistan

来源：

APPLIED SURFACE SCIENCE | 2000年 / 167卷 / 1-2期

关键词：

ZnTe thin film; refractive index; source temperature;

D O I：

10.1016/S0169-4332(00)00498-0

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Optical properties of ZnTe films, deposited by thermal evaporation of Zn and Te sources, were studied in the range of 400-2000 nm by UV-VIS-NIR spectrophotometer. Variations of refractive index with incident photon energy are fitted to a single oscillator model. Optical band gap and X-ray diffraction (XRD) have been reported for ZnTe films formed at substrate temperature of 300 degrees C with different evaporation rates. (C) 2000 Elsevier Science B.V. All rights reserved.

引用

页码：1 / 11

页数：11

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