High energy irradiation properties of CdTe/CdS solar cells

被引:10
作者
Bätzner, DL [1 ]
Romeo, A [1 ]
Döbeli, M [1 ]
Weinert, K [1 ]
Zogg, H [1 ]
Tiwari, AN [1 ]
机构
[1] Swiss Fed Inst Technol, Swiss Fed Inst Technol, Lab Solid State Phys, Thin Film Grp, CH-8005 Zurich, Switzerland
来源
CONFERENCE RECORD OF THE TWENTY-NINTH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE 2002 | 2002年
关键词
D O I
10.1109/PVSC.2002.1190766
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
The irradiation hardness of CdTe solar cells was investigated for extremely high fluence of protons (up to 10(14) cm(-2)) and electrons (up to 10(18) cm(-2)) since the degradation onset occurs at very high fluences. One general degradation characteristic for CdTe cells was calculated using a damage dose formulation, allowing a comprehensive comparison with other cell technologies. CdTe cells show an excellent radiation stability, superior to monocrystalline cells and also slightly superior to other thin film cells. Changes in the cell parameters are quantitatively correlated to recombination centres. For proton irradiation, a passivation of recombination centres at low and medium fluences is observed causing even an increases the efficiency. The damage recovery of CdTe cells shows an exponential time dependence.
引用
收藏
页码:982 / 985
页数:4
相关论文
共 8 条
[1]  
BATZNER DL, 2001, 17 EUR PVSEC MUN
[2]  
BATZNER DL, IN PRESS
[3]   Defect generation in Cu(In,Ga)Se2 heterojunction solar cells by high-energy electron and proton irradiation [J].
Jasenek, A ;
Rau, U .
JOURNAL OF APPLIED PHYSICS, 2001, 90 (02) :650-658
[4]  
La Roche G., 1997, Solargeneratoren f ur die Raumfahrt
[5]   Modeling solar cell degradation in space: A comparison of the NRL displacement damage dose and the JPL equivalent fluence approaches [J].
Messenger, SR ;
Summers, GP ;
Burke, EA ;
Walters, RJ ;
Xapsos, MA .
PROGRESS IN PHOTOVOLTAICS, 2001, 9 (02) :103-121
[6]  
ROMEO A, 1998, 2 WORLD C PHOT SOL E, P1105
[7]  
ROMEO A, 2001, MAT RES SOC S P, V668
[8]  
Ziegler J. F., 1985, The Stopping of Ions in Matter, P93, DOI DOI 10.1007/978