Structural, optical and electrical studies on spray deposited highly oriented ZnO films

被引：108

作者：

Lokhande, BJ ^{[1
]}

Uplane, MD ^{[1
]}

机构：

[1] Shivaji Univ, Dept Elect, Thin Film Phys Lab, Kolhapur 416004, Maharashtra, India

来源：

APPLIED SURFACE SCIENCE | 2000年 / 167卷 / 3-4期

关键词：

semiconductor; zinc oxide; characterization;

D O I：

10.1016/S0169-4332(00)00533-X

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Thin films of Zinc oxide (ZnO) have been prepared on glass substrates by spray pyrolysis techniques using 0.025 M aqueous solution of Zinc acetate. X-ray diffract ion (XRD) reveals that the films are polycrystalline in nature having hexagonal wurtzite type crystal structure. The room temperature resistivity is of the order of 10(-1) Omega cm. Estimated band gap energy from optical absorption data is around 3.27 eV. Thermoemf measurements show that films are of n-type. (C) 2000 Elsevier Science B.V. All rights reserved.

引用

页码：243 / 246

页数：4

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