Imaging objects hidden in scattering media with fluorescence polarization preservation of contrast agents
被引:21
作者:
Demos, SG
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机构:
CUNY City Coll, Inst Ultrafast Spect & Lasers, Dept Phys, New York, NY 10031 USACUNY City Coll, Inst Ultrafast Spect & Lasers, Dept Phys, New York, NY 10031 USA
Demos, SG
[1
]
Wang, WB
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机构:CUNY City Coll, Inst Ultrafast Spect & Lasers, Dept Phys, New York, NY 10031 USA
Wang, WB
Alfano, RR
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h-index: 0
机构:CUNY City Coll, Inst Ultrafast Spect & Lasers, Dept Phys, New York, NY 10031 USA
Alfano, RR
机构:
[1] CUNY City Coll, Inst Ultrafast Spect & Lasers, Dept Phys, New York, NY 10031 USA
[2] CUNY City Coll, New York State Ctr Adv Technol Ultrafast Photon M, New York, NY 10031 USA
来源:
APPLIED OPTICS
|
1998年
/
37卷
/
04期
关键词:
D O I:
10.1364/AO.37.000792
中图分类号:
O43 [光学];
学科分类号:
070207 ;
0803 ;
摘要:
A method for fluorescence polarization difference imaging is demonstrated for enhancing the image quality of a luminous object embedded in a random medium. The polarization preservation of light propagating in the scattering medium leads to partially polarized light emission by a contrast-agent dye located inside the object. Subtraction of the images of the luminous object detected at two orthogonal polarization directions improves the image resolution compared with a conventional optical imaging approach. (C) 1998 Optical Society of America.
机构:Optical Sciences and Ultrafast Science Laboratories, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI
CHEN, H
CHEN, Y
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机构:Optical Sciences and Ultrafast Science Laboratories, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI
CHEN, Y
DILWORTH, D
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机构:Optical Sciences and Ultrafast Science Laboratories, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI
DILWORTH, D
LEITH, E
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机构:Optical Sciences and Ultrafast Science Laboratories, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI
LEITH, E
LOPEZ, J
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机构:Optical Sciences and Ultrafast Science Laboratories, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI
LOPEZ, J
VALDMANIS, J
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机构:Optical Sciences and Ultrafast Science Laboratories, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI
机构:Optical Sciences and Ultrafast Science Laboratories, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI
CHEN, H
CHEN, Y
论文数: 0引用数: 0
h-index: 0
机构:Optical Sciences and Ultrafast Science Laboratories, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI
CHEN, Y
DILWORTH, D
论文数: 0引用数: 0
h-index: 0
机构:Optical Sciences and Ultrafast Science Laboratories, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI
DILWORTH, D
LEITH, E
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h-index: 0
机构:Optical Sciences and Ultrafast Science Laboratories, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI
LEITH, E
LOPEZ, J
论文数: 0引用数: 0
h-index: 0
机构:Optical Sciences and Ultrafast Science Laboratories, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI
LOPEZ, J
VALDMANIS, J
论文数: 0引用数: 0
h-index: 0
机构:Optical Sciences and Ultrafast Science Laboratories, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI