Surface structure of thin film blends of polystyrene and poly(n-butyl methacrylate)

被引:38
作者
Affrossman, S
Jerome, R
O'Neill, SA
Schmitt, T
Stamm, M
机构
[1] Univ Strathclyde, Dept Pure & Appl Chem, Glasgow G1 1XL, Lanark, Scotland
[2] Univ Liege, Ctr Educ & Res Macromol, B-4000 Liege, Belgium
[3] Max Planck Inst Polymerforsch, D-55021 Mainz, Germany
[4] Inst Polymerforsch Dresden EV, D-01005 Dresden, Germany
关键词
polymer blends; thin films; topography; polystyrene;
D O I
10.1007/s003960000358
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Thin films of blends of polystyrene (PS) and poly(n-butyl methacrylate) (PBMA) were prepared by spin-casting onto silicon wafers in order to map the lateral distribution of the two polymers. The surfaces were examined by atomic force microscopy (AFM) secondary ion mass spectroscopy X-ray photoelectron spectroscopy (XPS) and photoemission electron microscopy (PEEM). Films with PBMA contents of 50% w/w or less were relatively smooth, but further increase in the PBMA content produced, initially, protruding PS ribbons and then, for PBMA greater than or equal to 80% w/w, isolated PS islands. At all concentrations the topmost surface (0.5-1.0 nm) was covered by PBMA, whilst the PBMA concentration in the near-surface region, measured by XPS, increased with bulk content to eventual saturation. PEEM measurements of a PS-PBMA film at the composition at which ribbon features were observed by AFM also showed a PS-rich ribbon structure surrounded by a sea of mainly PBMA.
引用
收藏
页码:993 / 999
页数:7
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