Positron depth-profiling of polymer interfaces

被引：10

作者：

Gidley, DW ^{[1
]}

DeMaggio, GB

Frieze, WE

Zhu, M

Hristov, HA

Yee, AF

机构：

[1] Univ Michigan, Dept Phys, Ann Arbor, MI 48109 USA

[2] Univ Michigan, Dept Mat Sci & Engn, Ann Arbor, MI 48109 USA

来源：

POSITRON ANNIHILATION: ICPA-11 - PROCEEDINGS OF THE 11TH INTERNATIONAL CONFERENCE ON POSITRON ANNIHILATION, KANSAS CITY, MISSOURI, USA, MAY 1997 | 1997年 / 255-2卷

关键词：

positron; polycarbonate; glass transition; polymer films; polymer interfaces;

D O I：

10.4028/www.scientific.net/MSF.255-257.635

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Positron lifetime studies using a focused beam of low energy positrons have been extended to include polycarbonate (PC) thin films and bulk interfaces. The thermal expansion behavior of thin PC films deposited on Si(lll) wafers is compared with previous work on polystyrene films. The surface of a bulk PC sample that had undergone an exchange reaction at high temperature in contact with a PET sample to form a random copolymer interphase is depth profiled in order to determine the interphase thickness.

引用

页码：635 / 637

页数：3