500-nm-resolution 10 keV X-ray imaging transmission microscope with tantalum phase zone plates

被引:26
作者
Kagoshima, Y
Ibuki, T
Takai, K
Yokoyama, Y
Miyamoto, N
Tsusaka, Y
Matsui, J
机构
[1] Himeji Inst Technol, Fac Sci, Ako, Hyogo 6781297, Japan
[2] SPring I Serv Co Ltd, Ako, Hyogo 6781201, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 2000年 / 39卷 / 5A期
关键词
X-ray microscope; phase zone plate; high resolution; imaging microscope; synchrotron radiation;
D O I
10.1143/JJAP.39.L433
中图分类号
O59 [应用物理学];
学科分类号
摘要
An imaging transmission hard X-ray microscope has been constructed at the Hyogo-BL (BL24XU) of SPring-8. It makes use of X-ray phase zone plates (PZP's) made of tantalum as its condenser and objective lenses. The objective PZP has an outermost zone width of 250 nm, which corresponds to the theoretically expected spatial resolution of 300 nm. An experiment was performed at the photon energy of 10keV to check the performance of the microscope. Since a 250 nm line-and-space pattern was clearly resolved, we concluded that the microscope attained a spatial resolution limit better than 500 nm. A few samples were also examined and the feasibility of the microscope was successfully demonstrated.
引用
收藏
页码:L433 / L435
页数:3
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