Development of positron annihilation spectroscopy to test accelerated weathering of protective polymer coatings

被引:47
作者
Zhang, R
Cao, H
Chen, HM
Mallon, P
Sandreczki, T
Richardson, JR
Jean, YC [1 ]
Nielsen, B
Suzuki, R
Ohdaira, T
机构
[1] Univ Missouri, Dept Chem, Kansas City, MO 64110 USA
[2] Brookhaven Natl Lab, Dept Appl Sci, Upton, NY 11973 USA
[3] Electrotech Lab, Tsukuba, Ibaraki 305, Japan
关键词
positron beam; weathering; coatings; polymers; degradation;
D O I
10.1016/S0969-806X(00)00235-8
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A variable mono-energetic positron beam with a computer-controlled system has recently been constructed at the University of Missouri-Kansas City for weathering studies of polymeric coatings. The beam is designed to measure the S-parameter from Doppler-broadening energy spectra and the sub-nanometer defect properties from positron annihilation lifetimes (PAL). Significant variations of S-parameter and ortho-positronium intensity in coatings, as obtained from the newly built beam and from the Electrotechnical Laboratory's beam, respectively, are observed as a function of depth and exposure time due to the Xe-light irradiation. A high sensitivity of positron annihilation signal response to the early stage of degradation is observed. Development of positron annihilation spectroscopy to test accelerated weathering of polymeric coatings is discussed. (C) 2000 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:639 / 644
页数:6
相关论文
共 9 条
[1]   Free-volume hole model for positronium formation in polymers: surface studies [J].
Cao, H ;
Zhang, R ;
Yuan, JP ;
Huang, CM ;
Jean, YC ;
Suzuki, R ;
Ohdaira, T ;
Nielsen, B .
JOURNAL OF PHYSICS-CONDENSED MATTER, 1998, 10 (46) :10429-10442
[2]  
Cao H, 1999, J POLYM SCI POL PHYS, V37, P1289, DOI 10.1002/(SICI)1099-0488(19990615)37:12<1289::AID-POLB9>3.3.CO
[3]  
2-G
[4]   Degradation of polymer coating systems studied by positron annihilation spectroscopy. 1. UV irradiation effect [J].
Cao, H ;
Zhang, RW ;
Sundar, CS ;
Yuan, JP ;
He, Y ;
Sandreczki, TC ;
Jean, YC ;
Nielsen, B .
MACROMOLECULES, 1998, 31 (19) :6627-6635
[5]   A COMPUTER-CONTROLLED SYSTEM FOR SLOW POSITION IMPLANTATION SPECTROSCOPY [J].
CHILTON, NB ;
COLEMAN, PG .
MEASUREMENT SCIENCE AND TECHNOLOGY, 1995, 6 (01) :53-59
[6]  
COUGH RL, 1996, ADV CHEM SER, V249
[7]  
Schnabel W., 1982, Polymer Degradation: Principles and Practical Applications
[8]   INTERACTION OF POSITRON BEAMS WITH SURFACES, THIN-FILMS, AND INTERFACES [J].
SCHULTZ, PJ ;
LYNN, KG .
REVIEWS OF MODERN PHYSICS, 1988, 60 (03) :701-779
[9]   CHARACTERIZATION OF HYDROGENATED AMORPHOUS-SILICON FILMS BY A PULSED POSITRON BEAM [J].
SUZUKI, R ;
KOBAYASHI, Y ;
MIKADO, T ;
MATSUDA, A ;
MCELHENY, PJ ;
MASHIMA, S ;
OHGAKI, H ;
CHIWAKI, M ;
YAMAZAKI, T ;
TOMIMASU, T .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1991, 30 (10) :2438-2441