Laser-diode-stimulated emission depletion microscopy

被引：51

作者：

Westphal, V ^{[1
]}

Blanca, CM ^{[1
]}

Dyba, M ^{[1
]}

Kastrup, L ^{[1
]}

Hell, SW ^{[1
]}

机构：

[1] Max Planck Inst Biophys Chem, Dept Nanobiophoton, Gottingen, Germany

来源：

APPLIED PHYSICS LETTERS | 2003年 / 82卷 / 18期

关键词：

D O I：

10.1063/1.1571656

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report subdiffraction resolution in far-field fluorescence microscopy through laser-diode-stimulated emission depletion of molecular markers. The diode-generated focal intensities lead to a resolution improvement by similar to45% in both lateral directions. Excitation and stimulated emission are performed with electronically synchronized diode pulses of 50-70 ps and 300-400 ps duration, respectively. The subdiffraction resolution is utilized to resolve neighboring individual molecules. (C) 2003 American Institute of Physics.

引用

页码：3125 / 3127

页数：3

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