Structural characterisation and homoepitaxial growth on Cu(111)

被引:28
作者
Camarero, J
de la Figuera, J
de Miguel, JJ
Miranda, R
Alvarez, J
Ferrer, S
机构
[1] Univ Autonoma Madrid, Dept Fis Mat Condensada, E-28049 Madrid, Spain
[2] Univ Autonoma Madrid, Inst Ciencia Mat Nicolas Cabrera, E-28049 Madrid, Spain
[3] European Synchrotron Radiat Facil, F-38043 Grenoble, France
关键词
atom-solid scattering and diffraction - elastic; copper; diffusion and migration; molecular beam epitaxy; surface defects; surface structure; morphology; roughness; and topography; X-ray scattering; diffraction; and reflection;
D O I
10.1016/S0039-6028(00)00463-5
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A comprehensive study of the homoepitaxial MBE growth of Cu on Cu(111) is presented. This system displays a wealth of features and a large accumulation of morphological and structural defects. It is demonstrated that all of them can be ascribed to two basic characteristics of fcc-(111) faces: the presence of two threefold adsorption sites at the surface, which allows the formation of stacking faults, and the existence of high Ehrlich-Schwoebel barriers at steps, hindering interlayer diffusion. This behaviour, therefore, must be common during growth on compact metallic faces, and could have important implications for the preparation of low-dimensional heterostructures. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:191 / 205
页数:15
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